Alexei Zakharov
Titel
Forskningsingenjör
Organisation
046-2223357
+46733439556
Alexei [dot] Zakharov [at] maxlab [dot] lu [dot] se
Publikationer (hämtat ur Lunds universitets publikationsdatabas)
författare
- 2013
- 2012
- A micro-spectroscopy study on the influence of chemical residues from nanofabrication on the nitridation chemistry of Al nanopatterns
- Characterizing the geometry of InAs nanowires using mirror electron microscopy
- Formation and Structure of Graphene Waves on Fe(110)
- Influence of precipitation on initial high-temperature oxidation of Ti-Nb stabilized ferritic stainless steel SOFC interconnect alloy
- One-Dimensional Corrugation of the h-BN Monolayer on Fe(110)
- Recent advances in imaging of properties and growth of low dimensional structures for photonics and electronics by XPEEM
- Si intercalation/deintercalation of graphene on 6H-SiC(0001)
- Silicon intercalation into the graphene-SiC interface
- Studies of Li intercalation of hydrogenated graphene on SiC(0001)
- Surface Chemistry, Structure, and Electronic Properties from Microns to the Atomic Scale of Axially Doped Semiconductor Nanowires.
- 2011
- Ambipolar doping in quasifree epitaxial graphene on SiC(0001) controlled by Ge intercalation
- Doping profile of InP nanowires directly imaged by photoemission electron microscopy
- Formation of extended covalently bonded Ni porphyrin networks on the Au(111) surface
- Hydrogen intercalation of graphene grown on 6H-SiC(0001)
- Large area quasi-free standing monolayer graphene on 3C-SiC(111)
- Large-area homogeneous quasifree standing epitaxial graphene on SiC(0001): Electronic and structural characterization
- Nanoscale 3-D (E, k(x), k(y)) band structure imaging on graphene and intercalated graphene
- Stacking of adjacent graphene layers grown on C-face SiC
- 2010
- A low-energy electron microscopy and x-ray photo-emission electron microscopy study of Li intercalated into graphene on SiC(0001)
- Buffer layer free large area bi-layer graphene on SiC(0001)
- Effect of substrate nanopatterning on the growth and structure of pentacene films
- Epitaxial graphene on 6H-SiC and Li intercalation
- Faceting and surface reconstruction of the GaP(111)B surface
- Graphene Synthesis on Cubic SiC/Si Wafers. Perspectives for Mass Production of Graphene-Based Electronic Devices
- Growth Mechanism of Self-Catalyzed Group III-V Nanowires.
- Large homogeneous mono-/bi-layer graphene on 6H-SiC(0001) and buffer layer elimination
- ZnO nanocrystals on SiO2/Si surfaces thermally cleaned in ultrahigh vacuum and characterized using spectroscopic photoemission and low energy electron microscopy
- 2009
- Low temperature Ga surface diffusion from focused ion beam milled grooves.
- Ordering of the Nanoscale Step Morphology As a Mechanism for Droplet Self-Propulsion.
- Photoemission electron microscopy using extreme ultraviolet attosecond pulse trains
- Quasi-Free-Standing Epitaxial Graphene on SiC Obtained by Hydrogen Intercalation
- Self-Assembled Growth, Microstructure, and Field-Emission High-Performance of Ultrathin Diamond Nanorods
- Self-assembled growth, microstructure and field-emission high-performance of ultrathin diamond nanorods
- Spatial Structures Formed during High-Temperature Vacuum Annealing of Diamond-Like Film Deposited on a Silicon Substrate
- Substrate orientation: a way towards higher quality monolayer graphene growth on 6H-SiC(0001)
- 2008
- A single h-BN layer on Pt(111)
- Homogeneous large-area graphene layer growth on 6h-SiC(001)
- Investigation of Epitaxial Nd1.85Ce0.15CuO4-y Film Surface by Low Energy Electron Diffractometry
- Oxygen-etching of h-BN/Ru(0001) nanomesh on the nano- and mesoscopic scale
- Precise in situ thickness analysis of epitaxial graphene layers on SiC(0001) using low-energy electron diffraction and angle resolved ultraviolet photoelectron spectroscopy
- Repetitive ultrafast melting of InSb as an x-ray timing diagnostic
- 2007
- 2006
- 2005
- 2003
- 2002
- Anisotropy of the electronic structure of low-dimensional Sr(Ca)CuO2 single crystals studied by scanning photoelectron spectromicroscopy
- Investigation of PMMA resist residues using photoelectron microscopy
- Photoelectron spectromicroscopy study of Bi2Sr2CaCu2O8+x single crystal
- Quantative photoelectron spectromicroscopy for investigation of PMMA resist residues
- Scanning photoelectron microscopy study of as-grown and heat-treated chemical vapor deposition boron-doped diamond films
- Study of thin oxide films by electron, ion and synchrotron radiation beams
