Re-using Chip Level DFT at Board Level
Publikation/Tidskrift/Serie: [Host publication title missing]
Förlag: IEEE--Institute of Electrical and Electronics Engineers Inc.
As chips are getting increasingly complex, there is no surprise to find more and more built-in DFX. This built-in DFT is obviously beneficial for chip/silicon DFX engineers; however, board/system level DFX engineers often have limited access to the build in DFX features. There is currently an increasing demand from board/system level DFX engineers to reuse chip/silicon DFX at board/system level. This special session will discuss: What chip access is needed for board-level for test and diagnosis? How to accomplish the access? Will IEEE P1687 and IEEE 1149.1 solve these problems?
- Electrical Engineering, Electronic Engineering, Information Engineering
- Board test
- board diagnosis
- chip access
- IEEE P1687
- IEEE 1149.1
European Test Symposium
- Digital ASIC-lup-obsolete