Sizing of Dual-V-T Gates for Sub-V-T Circuits
Författare
Summary, in English
Publiceringsår
2012
Språk
Engelska
Publikation/Tidskrift/Serie
2012 IEEE Subthreshold Microelectronics Conference (SubVT)
Dokumenttyp
Konferensbidrag
Förlag
IEEE - Institute of Electrical and Electronics Engineers Inc.
Ämne
- Electrical Engineering, Electronic Engineering, Information Engineering
Conference name
IEEE Subthreshold Microelectronics Conference (SubVT)
Conference date
2012-10-09 - 2012-10-10
Status
Published
ISBN/ISSN/Övrigt
- ISBN: 978-1-4673-1586-9