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Accessing Embedded DfT Instruments with IEEE P1687

In English

Författare

Summary, in English

While the advancement in semiconductor technologies enables manufacturing of highly advanced and complex integrated circuits, there is an increasing need of embedded (on-chip) instruments for test, debug, diagnosis, configuration, monitoring, etc. A key challenge is how to access these instruments from chip terminals in a low-cost, non-intrusive, standardized, flexible and scalable manner. The well-adopted IEEE 1149.1 (Joint Test Action Group (JTAG)) standard offers low-cost, non- intrusive and standardized access but lacks flexibility and scalability, which is addressed by the on-going IEEE P1687 (Internal JTAG (IJTAG)) standardization initiative. This paper discusses the need of embedded instrumentation, the shortcomings of IEEE 1149.1 as well as features and challenges of IEEE P1687.

Publiceringsår

2012

Språk

Engelska

Sidor

71-76

Publikation/Tidskrift/Serie

IEEE 21st Asian Test Symposium (ATS), 2012

Dokumenttyp

Konferensbidrag

Förlag

IEEE - Institute of Electrical and Electronics Engineers Inc.

Ämne

  • Electrical Engineering, Electronic Engineering, Information Engineering

Nyckelord

  • IEEE P1687 IJTAG
  • IEEE 1149.1
  • embedded instruments

Conference name

IEEE 21st Asian Test Symposium (ATS)

Conference date

2012-11-20

Conference place

Niigata, Japan

Status

Published

Forskningsgrupp

  • Digital ASIC

ISBN/ISSN/Övrigt

  • ISSN: 1081-7735
  • ISBN: 978-1-4673-4555-2