Integrated Test Scheduling, Test Parallelization and TAM Design
Författare
Summary, in English
Publiceringsår
2002
Språk
Engelska
Sidor
397-404
Publikation/Tidskrift/Serie
[Host publication title missing]
Dokumenttyp
Konferensbidrag
Förlag
IEEE - Institute of Electrical and Electronics Engineers Inc.
Ämne
- Electrical Engineering, Electronic Engineering, Information Engineering
Nyckelord
- test access mechanism
- TAM
- TAM routing
- test scheduling
- scan chain partitioning
- test conflicts
- power constraints
Conference name
IEEE Asian Test Symposium ATS02
Conference date
2002-11-18 - 2002-11-20
Conference place
Guam, United States
Status
Published
ISBN/ISSN/Övrigt
- ISSN: 1081-7735
- ISBN: 0-7695-1825-7