Integrated Test Scheduling, Test Parallelization and TAM Design
Publikation/Tidskrift/Serie: [Host publication title missing]
Förlag: IEEE--Institute of Electrical and Electronics Engineers Inc.
We propose a technique integrating test scheduling, scan chain partitioning and test access mechanism (TAM) design minimizing the test time and the TAM routing cost while considering test conflicts and power constraints. Main features of our technique are (1) the flexibility in modelling the systems test behaviour and (2) the support for interconnection test of unwrapped cores and user-defined logic. Experiments using our implementation on several benchmarks and industrial designs demonstrate that it produces high quality solution at low computational cost.
- Electrical Engineering, Electronic Engineering, Information Engineering
- test access mechanism
- TAM routing
- test scheduling
- scan chain partitioning
- test conflicts
- power constraints
IEEE Asian Test Symposium ATS02
- ISSN: 1081-7735
- ISBN: 0-7695-1825-7