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X-ray diffuse scattering measurements of nucleation dynamics at femtosecond resolution

  • A. M. Lindenberg
  • S. Engemann
  • K. J. Gaffney
  • K. Sokolowski-Tinten
  • Jörgen Larsson
  • P. B. Hillyard
  • D. A. Reis
  • D. M. Fritz
  • J. Arthur
  • R. A. Akre
  • M. J. George
  • A. Deb
  • P. H. Bucksbaum
  • J. Hajdu
  • D. A. Meyer
  • M. Nicoul
  • C. Blome
  • Th. Tschentscher
  • A. L. Cavalieri
  • R. W. Falcone
  • S. H. Lee
  • R. Pahl
  • J. Rudati
  • P. H. Fuoss
  • A. J. Nelson
  • P. Krejcik
  • D. P. Siddons
  • P. Lorazo
  • J. B. Hastings
Publiceringsår: 2008
Språk: Engelska
Publikation/Tidskrift/Serie: Physical Review Letters
Volym: 100
Nummer: 13
Dokumenttyp: Artikel
Förlag: American Physical Society


Femtosecond time-resolved small and wide angle x-ray diffuse scattering techniques are applied to investigate the ultrafast nucleation processes that occur during the ablation process in semiconducting materials. Following intense optical excitation, a transient liquid state of high compressibility characterized by large-amplitude density fluctuations is observed and the buildup of these fluctuations is measured in real time. Small-angle scattering measurements reveal snapshots of the spontaneous nucleation of nanoscale voids within a metastable liquid and support theoretical predictions of the ablation process.



  • Physics and Astronomy


  • ISSN: 0031-9007

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