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Impact of bismuth incorporation into (Ga,Mn)As thin films on their structural and magnetic properties

Författare

  • K. Levchenko
  • T. Andrearczyk
  • J. Z. Domagala
  • T. Wosinski
  • T. Figielski
  • Janusz Sadowski

Summary, in English

Structural and magnetic properties of thin films of the (Ga,Mn)(Bi,As) quaternary diluted magnetic semiconductor grown by the low-temperature molecular-beam epitaxy technique on GaAs substrates have been investigated. High-resolution X-ray diffraction has been applied to characterize the structural quality and misfit strain in the films. Ferromagnetic Curie temperature and magnetocrystalline anisotropy of the films have been examined by using SQUID magnetometry and low-temperature magneto-transport measurements. Post-growth annealing treatment of the films has been shown to reduce the strain in the films and to enhance their Curie temperature. Significant increase in the magnitude of magneto-transport effects caused by incorporation of a small amount of Bi into the films is interpreted as a result of enhanced spinorbit coupling in the (Ga, Mn)(Bi, As) films. (C) 2015 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim

Publiceringsår

2015

Språk

Engelska

Sidor

1152-1155

Publikation/Tidskrift/Serie

Physica Status Solidi C

Volym

12

Issue

8

Dokumenttyp

Konferensbidrag

Förlag

Wiley-Blackwell

Ämne

  • Other Materials Engineering
  • Condensed Matter Physics

Nyckelord

  • Mn)(Bi
  • As)
  • (Ga
  • magnetic semiconductors
  • thin films
  • magneto-resistance
  • high-resolution
  • X-ray diffraction

Conference name

17th International Conference on Extended Defects in Semiconductors (EDS)

Conference date

2014-09-14 - 2014-09-19

Conference place

Göttingen, Germany

Status

Published

ISBN/ISSN/Övrigt

  • ISSN: 1862-6351
  • ISSN: 1610-1642