Webbläsaren som du använder stöds inte av denna webbplats. Alla versioner av Internet Explorer stöds inte längre, av oss eller Microsoft (läs mer här: * https://www.microsoft.com/en-us/microsoft-365/windows/end-of-ie-support).

Var god och använd en modern webbläsare för att ta del av denna webbplats, som t.ex. nyaste versioner av Edge, Chrome, Firefox eller Safari osv.

Probing of individual semiconductor nanowhiskers by TEM-STM

Författare

Summary, in English

Along with rapidly developing nanotechnology, new types of analytical instruments and techniques are needed. Here we report an alternative procedure for electrical measurements on semiconductor nanowhiskers, allowing precise selection and visual control at close to atomic resolution. We use a combination of two powerful microscope techniques, scanning tunneling microscopy (STM) and simultaneous viewing in a transmission electron microscope (TEM). The STM is mounted in the sample holder for the TEM. We describe here a method for creating an ohmic contact between the STM tip and the nanowhisker. We examine three different types of STM tips and present a technique for cleaning the STM tip in situ. Measurements on 1-mum-tall and 40-nm-thick epitaxially grown InAs nanowhiskers show an ohmic contact and a resistance of down to 7 kOmega.

Publiceringsår

2004

Språk

Engelska

Sidor

41-46

Publikation/Tidskrift/Serie

Microscopy and Microanalysis

Volym

10

Issue

1

Dokumenttyp

Artikel i tidskrift

Förlag

Cambridge University Press

Ämne

  • Chemical Sciences
  • Condensed Matter Physics

Status

Published

ISBN/ISSN/Övrigt

  • ISSN: 1435-8115