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SEM study of overload effects during fatigue crack growth using an image analyzing technique and potential drop measures

In English

Författare

Summary, in English

To study the mechanisms affecting the crack propagation rate for fatigue cracks exposed to an overload, an in situ scanning electron microscope technique was used, together with potential drop measurements. High-resolution images were analysed with an image analysis program to measure the displacements along the crack, and the potential drop technique was employed to measure the electrical contact between the fatigue crack surfaces. The crack closure level could, by image analysis, be determined as close as 1 μm from the crack tip. The indications from the image analysis pointed towards a somewhat lower closure load as compared to the potential drop technique. The effect of an overload on the crack propagation rate was found to depend on the magnitude of the overload in combination with the steady-state conditions. Both overload induced crack retardation and crack acceleration was noticed to occur. [ABSTRACT FROM AUTHOR]

Publiceringsår

2010

Språk

Engelska

Sidor

105-115

Publikation/Tidskrift/Serie

Fatigue & Fracture of Engineering Materials & Structures

Volym

33

Issue

2

Dokumenttyp

Artikel i tidskrift

Förlag

Wiley-Blackwell

Ämne

  • Materials Engineering
  • Applied Mechanics

Nyckelord

  • overload
  • Inconel 718
  • fatigue crack growth
  • image analysis
  • crack closure
  • scanning electron microscope

Status

Published

ISBN/ISSN/Övrigt

  • ISSN: 1460-2695