Ion-Implantation Control of Ferromagnetism in (Ga,Mn)As Epitaxial Layers
Författare
Summary, in English
Avdelning/ar
Publiceringsår
2010
Språk
Engelska
Sidor
794-798
Publikation/Tidskrift/Serie
Journal Of Electronic Materials
Volym
39
Issue
6
Dokumenttyp
Konferensbidrag
Förlag
Springer
Ämne
- Physical Sciences
- Natural Sciences
Nyckelord
- Raman spectroscopy
- high-resolution x-ray diffraction
- ion implantation
- Ferromagnetic semiconductor
- Mn)As
- (Ga
- SQUID
- magnetometry
Conference name
13th International Conference on Defects - Recognition, Imaging and Physics in Semiconductors (DRIP XIII)
Conference date
2009-09-13 - 2009-09-17
Status
Published
ISBN/ISSN/Övrigt
- ISSN: 1543-186X
- ISSN: 0361-5235