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Scanning gate imaging of quantum dots in 1D ultra-thin InAs/InP nanowires

Författare:
Publiceringsår: 2011
Språk: Engelska
Sidor:
Publikation/Tidskrift/Serie: Nanotechnology
Volym: 22
Nummer: 18
Dokumenttyp: Artikel
Förlag: IOP Publishing Ltd

Sammanfattning

We use a scanning gate microscope (SGM) to characterize one-dimensional ultra-thin (diameter approximate to 30 nm) InAs/InP heterostructure nanowires containing a nominally 300 nm long InAs quantum dot defined by two InP tunnel barriers. Measurements of Coulomb blockade conductance versus backgate voltage with no tip present are difficult to decipher. Using the SGM tip as a charged movable gate, we are able to identify three quantum dots along the nanowire: the grown-in quantum dot and an additional quantum dot near each metal lead. The SGM conductance images are used to disentangle information about individual quantum dots and then to characterize each quantum dot using spatially resolved energy-level spectroscopy. S Online supplementary data available from stacks.iop.org/Nano/22/185201/mmedia

Disputation

Nyckelord

  • Physics and Astronomy

Övriga

Published
Yes
  • ISSN: 0957-4484

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