A Distributed Architecture to Check Global Properties for Post-Silicon Debug
Författare
Summary, in English
Publiceringsår
2010
Språk
Engelska
Publikation/Tidskrift/Serie
Test Symposium (ETS), 2010 15th IEEE European
Dokumenttyp
Konferensbidrag
Förlag
IEEE - Institute of Electrical and Electronics Engineers Inc.
Ämne
- Electrical Engineering, Electronic Engineering, Information Engineering
Conference name
IEEE European Test Symposium (ETS'10), 2010
Conference date
2010-05-24 - 2010-05-28
Conference place
Prague, Czech Republic
Status
Published
ISBN/ISSN/Övrigt
- ISBN: 978-1-4244-5834-9