Test Scheduling of Modular System-on-Chip under Capture Power Constraint
Författare
Publiceringsår
2010
Språk
Engelska
Dokumenttyp
Konferensbidrag
Ämne
- Electrical Engineering, Electronic Engineering, Information Engineering
Conference name
IEEE Eleventh Workshop on RTL and High Level Testing, 2010
Conference date
2010-12-05 - 2012-12-06
Conference place
Shanghai, China
Status
Published