Publikationer
Scan Cell Reordering to Minimize Peak Power during Scan Testing of SoC
Avdelning/ar:
Publiceringsår: 2009
Språk: Engelska
Sidor: 43-48
Dokumenttyp: Konferensbidrag
Sammanfattning
Disputation
Nyckelord
- Technology and Engineering
Övrigt
10th IEEE Workshop on RTL and High Level Testing (WRTLT'09)
2013-11-29
Hongkong, China
Published
Yes
