SOC Test Optimization with Compression-Technique Selection
Författare
Publiceringsår
2008
Språk
Engelska
Dokumenttyp
Konferensbidrag
Ämne
- Electrical Engineering, Electronic Engineering, Information Engineering
Nyckelord
- systems-on-chip
- testing
- compression
Conference name
A Workshop in Conjunction with the International Test Conference
Conference date
0001-01-02
Status
Published