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Test Quality Analysis and Improvement for an Embedded Asynchronous FIFO

Författare:
  • Tobias Dubois
  • Erik Jan Marinissen
  • Mohamed Azimane
  • Paul Wielage
  • Erik Larsson
  • Clemens Wouters
Publiceringsår: 2007
Språk: Engelska
Sidor:
Dokumenttyp: Konferensbidrag
Förlag: IEEE Computer Society Press

Sammanfattning

Embedded First-InFirst-Out (FIFO) memories are increasingly used in many IC designs.We have created a new full-custom embedded FIFO module withasynchronous read and write clocks, which is at least a factor twosmaller and also faster than SRAM-based and standard-cell-basedcounterparts. The detection qualities of the FIFO test for bothhard and weak resistive shorts and opens have been analyzed by anIFA-like method based on analog simulation. The defect coverage ofthe initial FIFO test for shorts in the bit-cell matrix has beenimproved by inclusion of an additional data background andlow-voltage testing; for low-resistant shorts, 100% defect coverageis obtained. The defect coverage for opens has been improved by anew test procedure which includes waitingperiods.

Disputation

Nyckelord

  • Technology and Engineering
  • embedded systems
  • testing
  • FIFO
  • memory
  • test quality analysis

Övriga

Design, Automation, and Test in Europe DATE
2007-04-16/2007-04-20
Nice, France
Published
Yes
  • Digital ASIC
  • ISBN: 978-3-9810801-2-4

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