An Architecture for Combined Test Data Compression and Abort-on-Fail Test
Författare
Summary, in English
Publiceringsår
2007
Språk
Engelska
Sidor
726-731
Publikation/Tidskrift/Serie
[Host publication title missing]
Dokumenttyp
Konferensbidrag
Förlag
IEEE - Institute of Electrical and Electronics Engineers Inc.
Ämne
- Electrical Engineering, Electronic Engineering, Information Engineering
Nyckelord
- testing
- electronic systems
- test data compression
- unknowns
Conference name
Asia and South Pacific Design Automation Conference ASP-DAC '07
Conference date
2007-01-23 - 2007-01-26
Conference place
Yokohama, Japan
Status
Published
ISBN/ISSN/Övrigt
- ISBN: 1-4244-0629-3