Du är här

Abort-on-Fail Based Test Scheduling

Författare:
Publiceringsår: 2005
Språk: Engelska
Sidor: 651-658
Publikation/Tidskrift/Serie: Journal of electronic testing
Volym: 21
Nummer: 6
Dokumenttyp: Artikel

Sammanfattning

The long andincreasing test application time for modular core-basedsystem-on-chips is a major problem, and many approaches have beendeveloped to deal with the problem. Different from previousapproaches, where it is assumed that all tests will be performeduntil completion, we consider the cases where the test process isterminated as soon as a defect is detected. Such abort-on-failtesting is common practice in production test of chips. We define amodel to compute the expected test time for a given test schedulein an abort-on-fail environment. We have implemented threescheduling techniques and the experimental results show asignificant test time reduction (up to 90%) when making use of anefficient test scheduling technique that takes defect probabilitiesinto account.

Disputation

Nyckelord

  • Technology and Engineering
  • testing
  • test scheduling
  • abort-on-fail

Övrigt

Published
Yes
  • ISSN: 0923-8174

Box 117, 221 00 LUND
Telefon 046-222 00 00 (växel)
Telefax 046-222 47 20
lu [at] lu [dot] se

Fakturaadress: Box 188, 221 00 LUND
Organisationsnummer: 202100-3211
Om webbplatsen

LERU logo U21 logo