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The Design and Optimization of SOC Test Solutions

Författare:
Publiceringsår: 2001
Språk: Engelska
Sidor: 523-530
Dokumenttyp: Konferensbidrag
Förlag: IEEE Computer Society Press

Sammanfattning

We propose an integrated technique for extensive optimization of the final test solution for System-on-Chip using Simulated Annealing. The produced results from the technique are a minimized test schedule fulfilling test conflicts under test power constraints and an optimized design of the test access mechanism. We have implemented the proposed algorithm and performed experiments with several benchmarks and industrial designs to show the usefulness and efficiency of our technique.

Disputation

Nyckelord

  • Technology and Engineering
  • system-on-chip
  • testing
  • test conflicts
  • optimized design
  • embedded systems

Övriga

IEEE/ACM International Conference on Computer Aided Design, ICCAD 2001
2001-11-04/2001-11-08
San Jose, CA, USA
Published
Yes
  • ISSN: 1092-3152
  • ISBN: 0-7803-7247-6

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