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Power Constrained Preemptive TAM Scheduling

In English

Författare

Summary, in English

We integrate scan-chain partitioning and preemptive test access mechanism (TAM) scheduling for core-based systems under power constraint. We also outline a flexible power conscious test wrapper to increase the flexibility in the scheduling process by (1) allowing several different bandwidths at cores and (2) controlling the cores test power consumption, which makes it possible to increase the test clock. We model the scheduling problem as a Bin-packing problem and we discuss the transformations: (1) TAM-time and (2) power-time and the possibilities to achieve an optimal solution and the limitations. We have implemented our proposed preemptive TAM scheduling algorithm and through experiments we demonstrate its efficiency.

Publiceringsår

2002

Språk

Engelska

Sidor

119-119

Publikation/Tidskrift/Serie

[Host publication title missing]

Dokumenttyp

Konferensbidrag

Förlag

IEEE - Institute of Electrical and Electronics Engineers Inc.

Ämne

  • Electrical Engineering, Electronic Engineering, Information Engineering

Nyckelord

  • scan-chain partitioning
  • core-based systems
  • power constraint
  • test access mechanism
  • TAM
  • preemptive TAM scheduling

Conference name

7th IEEE European Test Workshop,2002

Conference date

2002-05-26 - 2002-05-29

Conference place

Corfu, Greece

Status

Published

ISBN/ISSN/Övrigt

  • ISSN: 1530-1877
  • ISBN: 0-7695-1715-3