Publikationer
Test Resource Partitioning and Optimization for SOC Designs
Avdelning/ar:
Publiceringsår: 2003
Språk: Engelska
Sidor:
Dokumenttyp: Konferensbidrag
Förlag: IEEE Computer Society Press
Sammanfattning
We propose a test resource partitioning and optimization technique for core-based designs. Our technique includes test set selection and test resource floor-planning with the aim of minimizing the total test application time and the routing of the added TAM (test access mechanism) wires. A feature of our approach is that it pinpoints bottlenecks that are likely to limit the test solution, which is important in the iterative test solution development process. We demonstrate the usefulness of the technique through a comparison with a test scheduling and TAM design tool.
Disputation
Nyckelord
- Technology and Engineering
- core-based design
- resource floor-planning
- test access mechanism
- TAM
- test scheduling
- TAM routing
Övrigt
2003 IEEE VLSI Test Symposium VTS03
2013-05-24
Published
Yes

