Identifying and Modelling Multipath Clusters using Measurement Data
Författare
Summary, in English
Publiceringsår
2010
Språk
Engelska
Publikation/Tidskrift/Serie
[Host publication title missing]
Dokumenttyp
Konferensbidrag
Förlag
IEEE - Institute of Electrical and Electronics Engineers Inc.
Ämne
- Electrical Engineering, Electronic Engineering, Information Engineering
Conference name
IEEE Vehicular Technology Conference (VTC Fall), 2010
Conference date
2010-09-06 - 2010-09-09
Conference place
Ottawa, Canada
Status
Published
ISBN/ISSN/Övrigt
- ISBN: 978-1-4244-3573-9