A single probe for imaging photons, electrons and physical forces
Författare
Summary, in English
The combination of complementary measurement techniques has become a frequent approach to improve scientific knowledge. Pairing of the high lateral resolution scanning force microscopy (SFM) with the spectroscopic information accessible through scanning transmission soft x-ray microscopy (STXM) permits assessing physical and chemical material properties with high spatial resolution. We present progress from the NanoXAS instrument towards using an SFM probe as an x-ray detector for STXM measurements. Just by the variation of one parameter, the SFM probe can be utilised to detect either sample photo-emitted electrons or transmitted photons. This allows the use of a single probe to detect electrons, photons and physical forces of interest. We also show recent progress and demonstrate the current limitations of using a high aspect ratio coaxial SFM probe to detect photo-emitted electrons with very high lateral resolution. Novel probe designs are proposed to further progress in using an SFM probe as a STXM detector.
Avdelning/ar
Publiceringsår
2016-05-05
Språk
Engelska
Publikation/Tidskrift/Serie
Nanotechnology
Volym
27
Issue
23
Länkar
Dokumenttyp
Artikel i tidskrift
Förlag
IOP Publishing
Ämne
- Nano Technology
Nyckelord
- carbon nanotube
- co-axial tip
- electron
- photon detection
- scanning force microscopy
- scanning probe
- x-ray microscopy
Status
Published
ISBN/ISSN/Övrigt
- ISSN: 0957-4484