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Design, Verification and Application of IEEE 1687

In English

Författare

  • Farrokh Ghani Zadegan
  • Erik Larsson
  • Artur Jutman
  • Sergei Devadze
  • René Krenz-Baath

Summary, in English

IEEE 1687 (IJTAG) has been developed to enable flexible and automated access to the increasing number of embedded instruments in today's integrated circuits. These instruments enable efficient post-silicon validation, debugging, wafer sort, package test, burn-in, bring-up and manufacturing test of printed circuit board assemblies, power-on self-test, and in-field test. Current paper presents an overview of challenges as well as selected examples in the following topics around IEEE 1687 networks: (1) design to efficiently access the embedded instruments, (2) verification to ensure correctness, and (3) fault management at functions performed in-field through the product's life time.

Publiceringsår

2014

Språk

Engelska

Sidor

93-100

Publikation/Tidskrift/Serie

[Host publication title missing]

Dokumenttyp

Konferensbidrag

Förlag

IEEE - Institute of Electrical and Electronics Engineers Inc.

Ämne

  • Electrical Engineering, Electronic Engineering, Information Engineering

Conference name

Asian Test Symposium (ATS14)

Conference date

2014-11-16 - 2014-11-19

Conference place

Hangzhou, China

Status

Published

ISBN/ISSN/Övrigt

  • ISSN: 1081-7735