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Fabrication and modeling of a combined gold nanoparticle-carbon nanotube single electron transistor

Författare:
Publiceringsår: 2002
Språk: Engelska
Sidor: 2
Publikation/Tidskrift/Serie: 7th International Conference on Nanometer-Scale Science and Technology and 21st European Conference on Surface Science
Dokumenttyp: Konferensbidrag
Förlag: Lund Univ

Sammanfattning

Scanning probe manipulation has been used to electrically connect two carbon nanotubes to an individual 7 nm gold particle, resulting in a system with multiple tunnel junctions. Single-electron charging effects in the gold particle was found to dominate the electrical transport measurements at T=4.2 K, whereas charging effects in the two carbon nanotube leads appeared as a fine structure. A simulation of the electrical transport in the system has been carried out using SIMON*, which is a Monte Carlo based simulation program for single-electronics. Using this program we have been able to fit a model to the experimental data and to explain the electrical transport characteristics

Disputation

Nyckelord

  • Technology and Engineering
  • electrical transport measurements
  • single electron charging effects
  • multiple tunnel junctions
  • electrical contacts
  • scanning probe manipulation
  • transistor modelling
  • transistor fabrication
  • single electron transistor
  • gold nanoparticle
  • carbon nanotube
  • fine structure
  • simulation of nanostructures
  • Monte Carlo based simulation
  • 7 nm
  • 4.2 K
  • Au-C

Övriga

Proceedings of 7th International Conference on Nanometer-Scale Science and Technology and 21st European Conference on Surface Science (NANO-7/ECOSS-21)
24-28 June 2002
Malmö, Sweden
Published
Yes

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