The environmental impacts of electronics. Going beyond the walls of semiconductor fabs
Författare
Summary, in English
Avdelning/ar
Publiceringsår
2004
Språk
Engelska
Sidor
159-165
Publikation/Tidskrift/Serie
Proceedings of the 2004 IEEE International Symposium on Electronics and the Environment (IEEE Cat. No.04CH37511)
Dokumenttyp
Konferensbidrag
Förlag
IEEE - Institute of Electrical and Electronics Engineers Inc.
Ämne
- Social Sciences Interdisciplinary
Nyckelord
- silicon chain energy intensity
- ultra-pure chemical manufacturing
- clean room standards
- raw material production
- material purity requirements
- LCA studies
- chemical manufacturing
- upstream life cycle stages
- semiconductor facilities
- raw material standards
- component density
- integrated circuit complexity
- electronics environmental impact
- semiconductor fabs
- wet chemicals
- production energy intensity
- process related energy data
- semiconductor chemicals
- high-grade chemicals
- life cycle assessment
Conference name
Proceedings of the 2004 IEEE International Symposium on Electronics and the Environment
Conference date
2004-05-10 - 2004-05-13
Conference place
Scottsdale, AZ, United States
Status
Published
ISBN/ISSN/Övrigt
- ISBN: 0-7803-8250-1