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Statistical analysis of the UWB channel in an industrial environment

Författare:
Publiceringsår: 2004
Språk: Engelska
Sidor: 81-85
Dokumenttyp: Konferensbidrag
Förlag: IEEE

Sammanfattning

In this paper, we present a statistical model for the ultra-wideband (UWB) channel in an industrial environment. Based on a set of measurements in a factory hall, we find that the abundance of metallic scatterers causes dense multipath scattering. This can be seen to produce mostly a Rayleigh distributed small-scale fading signal, with only a few paths exhibiting Nakagami distributions. For the power delay profile, we suggest a generalization of the Saleh-Valenzuela model where clusters with different excess delays have different ray power decay constants; the decay constants follow a linear dependence on the delay. This model provides an excellent fit to the measured data. We also note that for non-line-of-sight scenarios at larger distances, several hundred multipath components need to be collected to capture 50% of the available energy

Disputation

Nyckelord

  • Technology and Engineering
  • metallic scatterers
  • industrial environment
  • dense multipath scattering
  • nonline-of-sight scenarios
  • 3.1 to 10.6 GHz
  • ray power decay constants
  • UWB channel
  • power delay profile
  • statistical analysis
  • Saleh-Valenzuela model
  • Rayleigh distributed small-scale fading signal
  • Nakagami distributions
  • factory hall

Övrigt

IEEE Vehicular Technology Conference (VTC2004-fall)
2014-09-28
Los Angeles, CA, USA
Published
Yes
©2004 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
  • ISBN: 0-7803-8521-7

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