Detection of duplicate defect reports using natural language processing
Författare
Summary, in English
Avdelning/ar
Publiceringsår
2007
Språk
Engelska
Sidor
499-508
Publikation/Tidskrift/Serie
Proceedings - International Conference on Software Engineering
Dokumenttyp
Konferensbidrag
Förlag
IEEE - Institute of Electrical and Electronics Engineers Inc.
Ämne
- Computer Science
Nyckelord
- Sony Ericsson (CO)
- User testing
Conference name
29th International Conference on Software Engineering, ICSE 2007
Conference date
2007-05-20 - 2007-05-26
Conference place
Minneapolis, MN, United States
Status
Published
ISBN/ISSN/Övrigt
- ISSN: 0270-5257
- CODEN: PCSEDE