Webbläsaren som du använder stöds inte av denna webbplats. Alla versioner av Internet Explorer stöds inte längre, av oss eller Microsoft (läs mer här: * https://www.microsoft.com/en-us/microsoft-365/windows/end-of-ie-support).

Var god och använd en modern webbläsare för att ta del av denna webbplats, som t.ex. nyaste versioner av Edge, Chrome, Firefox eller Safari osv.

Correlation lengths in stacked InAs quantum dot systems studied by cross-sectional scanning tunnelling microscopy

In English

Författare

Summary, in English

We have studied the influence of the InP spacer layer thickness on stacked InAs/InP quantum dots, using cross-sectional scanning tunnelling microscopy. We show that for a spacer layer thickness of up to 30 nm, the quantum dots are spatially correlated but for a separating distance of 50 nm the vertical ordering of the dots is lost. These values are the same as previously found for quantum dots in the InAs/GaAs system despite the large difference in lattice mismatch between the InAs/GaAs ( 7%) and InAs/InP ( 3%) systems. We show that the apparent similarities can be understood by a combination of intermixing in the dots and differences in dot size. Finally, we demonstrate that the size of the quantum dots is affected by their vertical correlation.

Publiceringsår

2007

Språk

Engelska

Publikation/Tidskrift/Serie

Nanotechnology

Volym

18

Issue

14

Dokumenttyp

Artikel i tidskrift

Förlag

IOP Publishing

Ämne

  • Nano Technology

Status

Published

ISBN/ISSN/Övrigt

  • ISSN: 0957-4484