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Material characterization in partially filled waveguides using inverse scattering and multiple sample orientations

In English

Författare

Summary, in English

Abstract in Undetermined
We present a method aimed at reducing uncertainties and instabilities when characterizing materials in waveguide setups. The method is based on measuring the S parameters for three different orientations of a rectangular sample block in a rectangular waveguide. The corresponding geometries are modeled in a commercial full-wave simulation program, taking any material parameters as input. The material parameters of the sample are found by minimizing the squared distance between measured and calculated S parameters. The information added by the different sample orientations is quantified using the Cramer-Rao lower bound. The flexibility of the method allows the determination of material parameters of an arbitrarily shaped sample that fits in the waveguide.

Publiceringsår

2015

Språk

Engelska

Sidor

554-561

Publikation/Tidskrift/Serie

Radio Science

Volym

50

Issue

6

Dokumenttyp

Artikel i tidskrift

Förlag

American Geophysical Union (AGU)

Ämne

  • Other Electrical Engineering, Electronic Engineering, Information Engineering

Nyckelord

  • material characterization
  • waveguide
  • inverse scattering

Status

Published

Forskningsgrupp

  • Electromagnetic theory

ISBN/ISSN/Övrigt

  • ISSN: 0048-6604