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Surface Studies by Low-Energy Electron Diffraction and Reflection High-Energy-Electron Diffraction

In English

Författare

  • Pekka Laukkanen
  • Janusz Sadowski
  • Mircea Guina

Redaktör

  • A. Patane
  • N. Balkan

Summary, in English

In this chapter, we present the basic concepts of the low-energy electron diffraction (LEED) and reflection high-energy electron diffraction (RHEED) experiments. The main goal is to provide an overview of the exploitation of these instrumental methods for analyzing the surfaces of technologically important III–V compound semiconductors. In particular, the interpretation of LEED and RHEED patterns is discussed for the most representative reconstructions of GaAs(100), GaInAsN(100), and Bi-stabilized III–V(100) surfaces. Other application examples concern the use of RHEED for optimizing the growth conditions and growth rates used in molecular beam epitaxy of III–V device heterostructures.

Publiceringsår

2012

Språk

Engelska

Sidor

1-21

Publikation/Tidskrift/Serie

Springer Series in Materials Science

Volym

150

Dokumenttyp

Del av eller Kapitel i bok

Förlag

Springer

Ämne

  • Natural Sciences
  • Physical Sciences

Nyckelord

  • Low energy electron diffraction
  • reflection high energy electron diffraction
  • semiconductor surfaces
  • surface reconstruction

Status

Published

ISBN/ISSN/Övrigt

  • DOI: 10.1007/978-3-642-23351-7_1