Design and Modeling of a High-Speed Scanner for Atomic Force Microscopy
Författare
Avdelning/ar
Publiceringsår
2006
Språk
Engelska
Sidor
502-507
Publikation/Tidskrift/Serie
American Control Conference, 2006
Dokumenttyp
Konferensbidrag
Ämne
- Control Engineering
Conference name
American Control Conference, 2006
Conference date
2006-06-14 - 2006-06-16
Conference place
Minneapolis, Minnesota, United States
Status
Published