Statistical analysis of the UWB channel in an industrial environment
Författare
Summary, in English
Publiceringsår
2004
Språk
Engelska
Sidor
81-85
Publikation/Tidskrift/Serie
[Host publication title missing]
Fulltext
- Available as PDF - 311 kB
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Dokumenttyp
Konferensbidrag
Förlag
IEEE - Institute of Electrical and Electronics Engineers Inc.
Ämne
- Electrical Engineering, Electronic Engineering, Information Engineering
Nyckelord
- metallic scatterers
- industrial environment
- dense multipath scattering
- nonline-of-sight scenarios
- 3.1 to 10.6 GHz
- ray power decay constants
- UWB channel
- power delay profile
- statistical analysis
- Saleh-Valenzuela model
- Rayleigh distributed small-scale fading signal
- Nakagami distributions
- factory hall
Conference name
IEEE Vehicular Technology Conference (VTC2004-fall)
Conference date
2004-09-26 - 2004-09-29
Conference place
Los Angeles, CA, United States
Status
Published
ISBN/ISSN/Övrigt
- ISBN: 0-7803-8521-7