Meny

Javascript verkar inte påslaget? - Vissa delar av Lunds universitets webbplats fungerar inte optimalt utan javascript, kontrollera din webbläsares inställningar.
Du är här

Analysis of strain and stacking faults in single nanowires using Bragg coherent diffraction imaging

Författare:
Publiceringsår: 2010
Språk: Engelska
Publikation/Tidskrift/Serie: New Journal of Physics
Volym: 12
Dokumenttyp: Artikel i tidskrift
Förlag: IOP Publishing Ltd.

Sammanfattning

Coherent diffraction imaging (CDI) on Bragg reflections is a promising technique for the study of three-dimensional (3D) composition and strain fields in nanostructures, which can be recovered directly from the coherent diffraction data recorded on single objects. In this paper, we report results obtained for single homogeneous and heterogeneous nanowires with a diameter smaller than 100 nm, for which we used CDI to retrieve information about deformation and faults existing in these wires. We also discuss the influence of stacking faults, which can create artefacts during the reconstruction of the nanowire shape and deformation.

Nyckelord

  • Condensed Matter Physics
  • Electrical Engineering, Electronic Engineering, Information Engineering

Övriga

Published
  • Nano-lup-obsolete
  • ISSN: 1367-2630

Box 117, 221 00 LUND
Telefon 046-222 00 00 (växel)
Telefax 046-222 47 20
lu [at] lu.se

Fakturaadress: Box 188, 221 00 LUND
Organisationsnummer: 202100-3211
Om webbplatsen