Analysis of strain and stacking faults in single nanowires using Bragg coherent diffraction imaging
Publikation/Tidskrift/Serie: New Journal of Physics
Dokumenttyp: Artikel i tidskrift
Förlag: IOP Publishing Ltd.
Coherent diffraction imaging (CDI) on Bragg reflections is a promising technique for the study of three-dimensional (3D) composition and strain fields in nanostructures, which can be recovered directly from the coherent diffraction data recorded on single objects. In this paper, we report results obtained for single homogeneous and heterogeneous nanowires with a diameter smaller than 100 nm, for which we used CDI to retrieve information about deformation and faults existing in these wires. We also discuss the influence of stacking faults, which can create artefacts during the reconstruction of the nanowire shape and deformation.
- Condensed Matter Physics
- Electrical Engineering, Electronic Engineering, Information Engineering
- ISSN: 1367-2630