Publikationer
Direct atomically resolved imaging inside a nanowire
Avdelning/ar:
Publiceringsår: 2004
Språk: Engelska
Publikation/Tidskrift/Serie: Book of extended abstracts: Intl Conf on Scanning Probe Microscopy, Sensors and Nanostruct, Beijing, China (2004)
Dokumenttyp: Konferensbidrag
Sammanfattning
Disputation
Nyckelord
- Physics and Astronomy
Övrigt
Intl Conf on Scanning Probe Microscopy, Sensors and Nanostruct, Beijing, China (2004)
Published
Yes

