Webbläsaren som du använder stöds inte av denna webbplats. Alla versioner av Internet Explorer stöds inte längre, av oss eller Microsoft (läs mer här: * https://www.microsoft.com/en-us/microsoft-365/windows/end-of-ie-support).

Var god och använd en modern webbläsare för att ta del av denna webbplats, som t.ex. nyaste versioner av Edge, Chrome, Firefox eller Safari osv.

Soft-x-ray polarimeter with multilayer optics : Complete analysis of the polarization state of light

Författare

  • Franz Schäfers
  • Hans Christoph Mertins
  • Andreas Gaupp
  • Wolfgang Gudat
  • Marcel Mertin
  • Ingo Packe
  • Frank Schmolla
  • Silvia Di Fonzo
  • Gérard Soullié
  • Werner Jark
  • Richard Walker
  • Xavier Le Cann
  • Ralf Nyholm
  • Mikael Eriksson

Summary, in English

The design of a versatile high-precision eight-axis ultrahigh-vacuum-compatible polarimeter is presented. This multipurpose instrument can be used as a self-calibrating polarization detector for linearly and circularly polarized UV and soft-x-ray light. It can also be used for the characterization of reflection or transmission properties (reflectometer) or polarizing and phase-retarding properties (ellipsometer) of any optical element. The polarization properties of Mo/Si, Cr/C, Cr/Sc, and Ni/Ti multilayers used in this polarimeter as polarizers in transmission and as analyzers in reflection have been investigated theoretically and experimentally. In the soft-x-ray range, close to the 2p edges of Sc, Ti, and Cr, resonantly enhanced phase retardation of the transmission polarizers of as much as 18° has been measured. With these newly developed optical elements the complete polarization analysis of soft-x-ray synchrotron radiation can be extended to the water-window range from 300 to 600 eV.

Publiceringsår

1999-07-01

Språk

Engelska

Sidor

4074-4088

Publikation/Tidskrift/Serie

Applied Optics

Volym

38

Issue

19

Dokumenttyp

Artikel i tidskrift

Förlag

Optical Society of America

Ämne

  • Accelerator Physics and Instrumentation

Status

Published

ISBN/ISSN/Övrigt

  • ISSN: 1559-128X