Enhanced surface sensitivity in AES relative to XPS observed in free argon clusters

Summary, in English

The surface-to-bulk intensity ratio in Auger electron spectra has been studied in comparison with core-level photoelectron spectra using free argon clusters of sizes ranging over two orders of magnitude. Enhanced surface sensitivity is observed in L2,3M2,3M2.3 Auger electron spectra compared to 2p photoelectron spectra where electrons of similar kinetic energies were recorded. This is discussed in terms of the effective attenuation length of the electrons.

• Författare: M Lundwall; Maxim Tchaplyguine; G Ohrwall; A Lindblad; Sergey Peredkov; T Rander; S Svensson; O Bjorneholm
• Avdelning/ar: MAX IV-laboratoriet; Synkrotronljusfysik
• Publiceringsår: 2005
• Språk: Engelska
• Sidor: 12-19
• Publikation/Tidskrift/Serie: Surface Science
• Volym: 594
• Issue: 1-3
• Länkar: http://dx.doi.org/10.1016/j.susc.2005.07.007
• Dokumenttyp: Artikel i tidskrift
• Förlag: Elsevier
• Ämne: Natural Sciences; Atom and Molecular Physics and Optics; Physical Sciences
• Nyckelord: photoelectron; Auger ejection; photoelectron spectroscopy; spectroscopy; Auger electron; surface sensitivity; effective attenuation length-; synchrotron radiation photoelectron spectroscopy; emission
• Status: Published
• ISBN/ISSN/Övrigt: ISSN: 0039-6028