Statistical parametric mapping of functional MRI data using wavelets adapted to the cerebral cortex
Författare
Summary, in English
Publiceringsår
2013
Språk
Engelska
Sidor
1070-1073
Publikation/Tidskrift/Serie
[Host publication title missing]
Länkar
Dokumenttyp
Konferensbidrag
Ämne
- Electrical Engineering, Electronic Engineering, Information Engineering
Nyckelord
- Statistical testing
- functional MRI
- spectral graph theory
- graph
- wavelet transform
- wavelet thresholding
Conference name
10th IEEE International Symposium on Biomedical Imaging - From Nano to Macro (ISBI)
Conference date
2013-04-07 - 2013-04-11
Conference place
San Francisco, CA, United States
Status
Published
ISBN/ISSN/Övrigt
- ISSN: 1945-8452
- ISSN: 1945-7928