Gaia on-board metrology: basic angle and best focus
Författare
Summary, in English
Avdelning/ar
Publiceringsår
2014
Språk
Engelska
Sidor
91430-91430
Publikation/Tidskrift/Serie
Space Telescopes and Instrumentation 2014: Optical, Infrared, and Millimeter Wave
Volym
9143
Dokumenttyp
Konferensbidrag
Förlag
SPIE
Ämne
- Astronomy, Astrophysics and Cosmology
Nyckelord
- Astrometry
- Gaia
- metrology
- interferometry
- basic angle monitor
- wavefront sensor
- Shack-Hartmann
- wavefront reconstruction
- centroid
- Cramer-Rao
- spectral resolution
Conference name
Conference on Space Telescopes and Instrumentation - Optical, Infrared, and Millimeter Wave
Conference date
2014-06-22 - 2014-06-27
Conference place
Montreal, Canada
Status
Published
ISBN/ISSN/Övrigt
- ISSN: 1996-756X
- ISSN: 0277-786X