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Re-using Chip Level DFT at Board Level

  • Xinli Gu
  • Jeff Rearick
  • Bill Eklow
  • Jun Qian
  • Artur Jutman
  • Krishnendu Chakrabarty
  • Erik Larsson
Publiceringsår: 2012
Språk: Engelska
Sidor: 205-205
Publikation/Tidskrift/Serie: [Host publication title missing]
Dokumenttyp: Konferensbidrag
Förlag: IEEE--Institute of Electrical and Electronics Engineers Inc.


As chips are getting increasingly complex, there is no surprise to find more and more built-in DFX. This built-in DFT is obviously beneficial for chip/silicon DFX engineers; however, board/system level DFX engineers often have limited access to the build in DFX features. There is currently an increasing demand from board/system level DFX engineers to reuse chip/silicon DFX at board/system level. This special session will discuss: What chip access is needed for board-level for test and diagnosis? How to accomplish the access? Will IEEE P1687 and IEEE 1149.1 solve these problems?


  • Electrical Engineering, Electronic Engineering, Information Engineering
  • Board test
  • board diagnosis
  • chip access
  • IEEE P1687
  • IEEE 1149.1


European Test Symposium
  • Digital ASIC-lup-obsolete

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