The Design and Optimization of SOC Test Solutions
Författare
Summary, in English
Publiceringsår
2001
Språk
Engelska
Sidor
523-530
Publikation/Tidskrift/Serie
[Host publication title missing]
Dokumenttyp
Konferensbidrag
Förlag
IEEE - Institute of Electrical and Electronics Engineers Inc.
Ämne
- Electrical Engineering, Electronic Engineering, Information Engineering
Nyckelord
- system-on-chip
- testing
- test conflicts
- optimized design
- embedded systems
Conference name
IEEE/ACM International Conference on Computer Aided Design, ICCAD 2001
Conference date
2001-11-04 - 2001-11-08
Conference place
San Jose, CA, United States
Status
Published
ISBN/ISSN/Övrigt
- ISSN: 1092-3152
- ISBN: 0-7803-7247-6