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Strain and shape of epitaxial InAs/InP nanowire superlattice measured by grazing incidence X-ray techniques

  • Joel Eymery
  • Francois Rieutord
  • Vincent Favre-Nicolin
  • Odile Robach
  • Yann-Michel Niquet
  • Linus Fröberg
  • Thomas Mårtensson
  • Lars Samuelson
Publiceringsår: 2007
Språk: Engelska
Sidor: 2596-2601
Publikation/Tidskrift/Serie: Nano Letters
Volym: 7
Nummer: 9
Dokumenttyp: Artikel i tidskrift
Förlag: The American Chemical Society


Quantitative structural information about epitaxial arrays of nanowires are reported for a InAs/InP longitudinal heterostructure grown by chemical beam epitaxy on an InAs (111)(B) substrate. Grazing incidence X-ray diffraction allows the separation of the nanowire contribution from the substrate overgrowth and gives averaged information about crystallographic phases, epitaxial relationships (with orientation distribution), and strain. In-plane strain in homogeneities, intrinsic to the nanowires geometry, are measured and compared to atomistic simulations. Small-angle X-ray scattering evidences the hexagonal symmetry of the nanowire cross-section and provides a rough estimate of size fluctuations.


  • Nano Technology


  • ISSN: 1530-6992

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