Cycle-Accurate Test Power Modeling and its Application to SoC Test Scheduling
Författare
Summary, in English
Publiceringsår
2006
Språk
Engelska
Sidor
1-32
Publikation/Tidskrift/Serie
[Host publication title missing]
Dokumenttyp
Konferensbidrag
Förlag
IEEE - Institute of Electrical and Electronics Engineers Inc.
Ämne
- Electrical Engineering, Electronic Engineering, Information Engineering
Nyckelord
- testing
- system-on-chip
- test scheduling
- power modelling
Conference name
IEEE International Test Conference ITC '06
Conference date
2006-10-24 - 2006-10-26
Conference place
Santa Clara, CA, United States
Status
Published
ISBN/ISSN/Övrigt
- ISSN: 1089-3539
- ISBN: 1-4244-0292-1