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Test Scheduling and Scan-Chain Division Under Power Constraint

Publiceringsår: 2001
Språk: Engelska
Sidor: 259-259
Publikation/Tidskrift/Serie: [Host publication title missing]
Dokumenttyp: Konferensbidrag
Förlag: IEEE--Institute of Electrical and Electronics Engineers Inc.


An integrated technique for test scheduling and scan-chain division under power constraints is proposed in this paper. We demonstrate that optimal test time can be achieved for systems tested by an arbitrary number of tests per core using scan-chain division and we define an algorithm for it. The design of wrappers to allow different lengths of scan-chains per core is also outlined. We investigate the practical limitations of such wrapper design and make a worst case analysis that motivates our integrated test scheduling and scan-chain division algorithm. The efficiency and usefulness of our approach have been demonstrated with an industrial design.


  • Electrical Engineering, Electronic Engineering, Information Engineering
  • scan-chain
  • test scheduling
  • wrapper design
  • testing
  • embedded systems


Tenth Asian Test Symposium ATS 2001
  • ISSN: 1081-7735
  • ISBN: 0-7695-1378-6

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