X-Ray Analysis: Elemental Trace Analysis at the 10-12 g Level
Författare
Summary, in English
Using protons in the MeV region as excitation source and a high resolution Si(Li)-detector, X-ray analysis is capable of detecting many elements at the 10−12 g level simultaneously.
Publiceringsår
1970
Språk
Engelska
Sidor
141-143
Publikation/Tidskrift/Serie
Nuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment
Volym
84
Issue
1
Dokumenttyp
Artikel i tidskrift
Förlag
Elsevier
Ämne
- Subatomic Physics
- Production Engineering, Human Work Science and Ergonomics
Nyckelord
- PIXE
- particle induced X-ray emission analysis
- trace element analysis
Status
Published
ISBN/ISSN/Övrigt
- ISSN: 0167-5087