Direct atomically resolved imaging inside a nanowire
Författare
Avdelning/ar
Publiceringsår
2004
Språk
Engelska
Publikation/Tidskrift/Serie
Book of extended abstracts: Intl Conf on Scanning Probe Microscopy, Sensors and Nanostruct, Beijing, China (2004)
Dokumenttyp
Konferensbidrag
Ämne
- Atom and Molecular Physics and Optics
- Condensed Matter Physics
Conference name
Intl Conf on Scanning Probe Microscopy, Sensors and Nanostruct, Beijing, China (2004)
Conference date
0001-01-02
Status
Published