Power Constrained Preemptive TAM Scheduling
Publikation/Tidskrift/Serie: [Host publication title missing]
Förlag: IEEE--Institute of Electrical and Electronics Engineers Inc.
We integrate scan-chain partitioning and preemptive test access mechanism (TAM) scheduling for core-based systems under power constraint. We also outline a flexible power conscious test wrapper to increase the flexibility in the scheduling process by (1) allowing several different bandwidths at cores and (2) controlling the cores test power consumption, which makes it possible to increase the test clock. We model the scheduling problem as a Bin-packing problem and we discuss the transformations: (1) TAM-time and (2) power-time and the possibilities to achieve an optimal solution and the limitations. We have implemented our proposed preemptive TAM scheduling algorithm and through experiments we demonstrate its efficiency.
- Electrical Engineering, Electronic Engineering, Information Engineering
- scan-chain partitioning
- core-based systems
- power constraint
- test access mechanism
- preemptive TAM scheduling
7th IEEE European Test Workshop,2002
- ISSN: 1530-1877
- ISBN: 0-7695-1715-3