SOC Test Scheduling with Test Set Sharing and Broadcasting
Författare
Summary, in English
Publiceringsår
2005
Språk
Engelska
Sidor
162-162
Publikation/Tidskrift/Serie
[Host publication title missing]
Dokumenttyp
Konferensbidrag
Förlag
IEEE - Institute of Electrical and Electronics Engineers Inc.
Ämne
- Electrical Engineering, Electronic Engineering, Information Engineering
Nyckelord
- testing
- system-on-chip
- test scheduling
- overlapping test patterns
- constraint logic programming
Conference name
IEEE Asian Test Symposium
Conference date
2005-12-18 - 2005-12-21
Conference place
Calcutta, India
Status
Published