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Investigation of Epitaxial Nd1.85Ce0.15CuO4-y Film Surface by Low Energy Electron Diffractometry

In English

Författare

  • M. B. Tsetlin
  • Alexei Zakharov
  • A. P. Menushenkov
  • A. A. Ivanov
  • M. N. Mikheeva
  • Ingolf Lindau

Summary, in English

The surface of epitaxial Nd1.85Ce0.15CuO4-y(001) (NCCO) film has been studied by low energy electron diffractometry (LEED) and photoelectron spectroscopy. Ar+ ion etching of a surface with subsequent annealing in oxygen at atmosphere pressure has been found to lead to the ordered structure restoration of surface layers with the symmetry type and lattice parameters corresponding to the NCCO phase. Annealing in vacuum at temperatures close to the boundary of thermodynamic phase stability results in the formation of epitaxial Ce0.5Nd0.5O1.75 phase on a surface that is indicated in the LEED pattern as additional spots corresponding to the surface lattice (root 2 x root 2) R45 degrees.

Publiceringsår

2008

Språk

Engelska

Sidor

928-930

Publikation/Tidskrift/Serie

Journal Of Surface Investigation-X-Ray Synchrotron And Neutron Techniques

Volym

2

Issue

6

Dokumenttyp

Artikel i tidskrift

Förlag

MAIK Nauka/Interperiodica

Ämne

  • Natural Sciences
  • Physical Sciences

Status

Published

ISBN/ISSN/Övrigt

  • ISSN: 1027-4510