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Investigation of Epitaxial Nd1.85Ce0.15CuO4-y Film Surface by Low Energy Electron Diffractometry

Publiceringsår: 2008
Språk: Engelska
Sidor: 928-930
Publikation/Tidskrift/Serie: Journal Of Surface Investigation-X-Ray Synchrotron And Neutron Techniques
Volym: 2
Nummer: 6
Dokumenttyp: Artikel i tidskrift
Förlag: MAIK Nauka/Interperiodica


The surface of epitaxial Nd1.85Ce0.15CuO4-y(001) (NCCO) film has been studied by low energy electron diffractometry (LEED) and photoelectron spectroscopy. Ar+ ion etching of a surface with subsequent annealing in oxygen at atmosphere pressure has been found to lead to the ordered structure restoration of surface layers with the symmetry type and lattice parameters corresponding to the NCCO phase. Annealing in vacuum at temperatures close to the boundary of thermodynamic phase stability results in the formation of epitaxial Ce0.5Nd0.5O1.75 phase on a surface that is indicated in the LEED pattern as additional spots corresponding to the surface lattice (root 2 x root 2) R45 degrees.


  • Natural Sciences
  • Physical Sciences


  • ISSN: 1027-4510

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