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New Flexible Toolbox for Nanomechanical Measurements with Extreme Precision and at Very High Frequencies.

Publiceringsår: 2010
Språk: Engelska
Sidor: 3893-3898
Publikation/Tidskrift/Serie: Nano Letters
Volym: 10
Nummer: Online August 26, 2010
Dokumenttyp: Artikel i tidskrift
Förlag: The American Chemical Society


We show that the principally two-dimensional (2D) scanning tunneling microscope (STM) can be used for imaging of 1D micrometer high free-standing nanowires. We can then determine nanowire megahertz resonance frequencies, image their top-view 2D resonance shapes, and investigate axial stress on the nanoscale. Importantly, we demonstrate the extreme sensitivity of electron tunneling even at very high frequencies by measuring resonances at hundreds of megahertz with a precision far below the angstrom scale.


  • Nano Technology


  • ISSN: 1530-6992

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